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Optical Engineering

Applying branching processes theory for building a statistical model for scanning electron microscope signal
Author(s): Ira Cohen; Rotem Golan; Stanley R. Rotman
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Paper Details

Date Published: 1 January 2000
PDF: 6 pages
Opt. Eng. 39(1) doi: 10.1117/1.602358
Published in: Optical Engineering Volume 39, Issue 1
Show Author Affiliations
Ira Cohen, Opal Technologies (Israel)
Rotem Golan, Ben-Gurion Univ. (Israel)
Stanley R. Rotman, Ben-Gurion Univ. of the Negev (Israel)


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