Share Email Print

Optical Engineering

Analysis of 3-D surface waviness on standard artifacts by retroreflective metrology
Author(s): XianZhu Zhang; Walter P. T. North
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

Retroreflective metrology has been used to measure the 3-D surface waviness on standard artifacts. An optical configuration was constructed for the measurement, in which the grating image is produced by projection. The three-step algorithm of phase-shifting technology was applied to analyze the image. Two standard artifacts with 8.0- and 16.0-µm peak-to-peak wave amplitudes were tested. The experiments show that retroreflective metrology can successfully recover the contour and amplitude of the surface waviness on the standard artifacts. © 2000 Society of Photo-Optical Instrumentation Engineers. [S0091-3286(00)02101-2]

Paper Details

Date Published: 1 January 2000
PDF: 4 pages
Opt. Eng. 39(1) doi: 10.1117/1.602350
Published in: Optical Engineering Volume 39, Issue 1
Show Author Affiliations
XianZhu Zhang, Univ. of Windsor (Canada)
Walter P. T. North, Univ. of Windsor (Canada)

© SPIE. Terms of Use
Back to Top