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Optical Engineering

Invariant pattern recognition: smart algorithms for segmented two-dimensional patterns with an axis of symmetry
Author(s): Jianping Yao; Guy J. Lebreton
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Paper Abstract

We propose an approach to realize distortion-invariant pattern recognition for segmented 2-D patterns with an axis of symmetry. Parameters of distorted input pattern are first estimated and normalized. Invariant pattern recognition is then achieved by correlating the normalized input pattern with the undistorted reference, using a classical matched filter or its modified version. This approach realizes pattern recognition invariant to rotation, scale, and projection without the need to synthesize a distortion-invariant filter. Simulation results demonstrate the effectiveness of this approach.

Paper Details

Date Published: 1 December 1999
PDF: 7 pages
Opt. Eng. 38(12) doi: 10.1117/1.602306
Published in: Optical Engineering Volume 38, Issue 12
Show Author Affiliations
Jianping Yao, Nanyang Technological Univ. (Canada)
Guy J. Lebreton, Univ. de Toulon et du Var (France)


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