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Optical Engineering

Measurement and control of thin film uniformity in hollow glass waveguides
Author(s): Christopher D. Rabii; James A. Harrington
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Paper Details

Date Published: 1 December 1999
PDF: 7 pages
Opt. Eng. 38(12) doi: 10.1117/1.602304
Published in: Optical Engineering Volume 38, Issue 12
Show Author Affiliations
Christopher D. Rabii, Premier Laser Systems (United States)
James A. Harrington, Rutgers Univ. (United States)

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