Share Email Print

Optical Engineering

Dynamic minimum resolvable temperature testing for staring array imagers
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 May 1999
PDF: 7 pages
Opt. Eng. 38(5) doi: 10.1117/1.602281
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Curtis M. Webb, Northrop Grumman Corp. (United States)
Carl E. Halford, Univ. of Memphis (United States)

© SPIE. Terms of Use
Back to Top