Share Email Print

Optical Engineering

Image binarization techniques for correlation-based pattern recognition
Author(s): W. C. Hasenplaugh; Mark Allen Neifeld
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 November 1999
PDF: 11 pages
Opt. Eng. 38(11) doi: 10.1117/1.602241
Published in: Optical Engineering Volume 38, Issue 11
Show Author Affiliations
W. C. Hasenplaugh, Univ. of Arizona (United States)
Mark Allen Neifeld, Optical Sciences Ctr./Univ. of Arizona (United States)

© SPIE. Terms of Use
Back to Top