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Optical Engineering

Bias-free procedure for the measurement of the minimum resolvable temperature difference and minimum resolvable contrast
Author(s): Piet Bijl; J. Mathieu Valeton
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Paper Details

Date Published: 1 October 1999
PDF: 8 pages
Opt. Eng. 38(10) doi: 10.1117/1.602226
Published in: Optical Engineering Volume 38, Issue 10
Show Author Affiliations
Piet Bijl, TNO Human Factors Research Institute (Netherlands)
J. Mathieu Valeton, TNO Human Factors Research Institute (Netherlands)


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