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Optical Engineering

Nondestructive assessment of thinning of plates using digital shearography
Author(s): Rajpal S. Sirohi; Cho Jui Tay; Huai Min Shang; W. P. Boo
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Paper Abstract

A novel method of estimating the remaining thickness of a defective plate having the form of localized thinning using digital shearography, based on a simple relationship between the curvature of the deflected defect and the defect geometry is presented.

Paper Details

Date Published: 1 September 1999
PDF: 4 pages
Opt. Eng. 38(9) doi: 10.1117/1.602210
Published in: Optical Engineering Volume 38, Issue 9
Show Author Affiliations
Rajpal S. Sirohi, Indian Institute of Technology (India)
Cho Jui Tay, Institute of Microelectronics (Singapore)
Huai Min Shang, National Univ. of Singapore (Singapore)
W. P. Boo, National Univ. of Singapore (Singapore)


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