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Optical Engineering

Moire interferometry with elliptically polarized waves
Author(s): Pavel Vaclavik; Jiri Minster
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Paper Details

Date Published: 1 April 1999
PDF: 6 pages
Opt. Eng. 38(4) doi: 10.1117/1.602195
Published in: Optical Engineering Volume 38, Issue 4
Show Author Affiliations
Pavel Vaclavik, Czech Technical Univ. (Czech Republic)
Jiri Minster, Czech Academy of Sciences (Czech Republic)

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