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Optical Engineering

Moire interferometry with elliptically polarized waves
Author(s): Pavel Vaclavik; Jiri Minster
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Paper Abstract

A method is presented for the process of elimination of the influence of ellipticity of interfering waves in moire interferometry, using a combination of an analytical solution and direct measurements of ellipticity parameters of each interfering wave. The method is advantageous in that it makes it possible to access and overcome the unfavorable influence of ellipticity. The phase difference of interfering waves is described. A model case is used to show the influence of wave ellipticity and the fluctuation of light source output on the mean irradiation intensity of the interference field, visibility of fringes, and the error of the phase function determination.

Paper Details

Date Published: 1 April 1999
PDF: 6 pages
Opt. Eng. 38(4) doi: 10.1117/1.602195
Published in: Optical Engineering Volume 38, Issue 4
Show Author Affiliations
Pavel Vaclavik, Czech Technical Univ. (Czech Republic)
Jiri Minster, Czech Academy of Sciences (Czech Republic)

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