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Optical Engineering

Fabrication of single-mode chalcogenide fiber probes for scanning near-field infrared optical microscopy
Author(s): David T. Schaafsma; Reza Mossadegh; Jasbinder Singh Sanghera; Ishwar D. Aggarwal; M. Luce; Renato Generosi; P. Perfetti; Antonio Cricenti; Jonathan M. Gilligan; Norman H. Tolk
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Paper Abstract

We fabricate scanning near-field optical microscope (IR- SNOM) probe tips made from singlemode chalcogenide fiber and test them using a standard SNOM setup and free-electron laser. SEM micrographs, showing tips with submicrometer physical dimensions, demonstrate the feasibility of the thermal micropipette puller process used to create the tips. Topographical data obtained using a shear-force nearfield microscope exhibit spatial resolution in the range of 80 to 100 nm. Optical data in the IR (near 3.5 µm), using the probe tips in collection mode, indicate an optical spatial resolution of approximately ?/15.

Paper Details

Date Published: 1 August 1999
PDF: 5 pages
Opt. Eng. 38(8) doi: 10.1117/1.602181
Published in: Optical Engineering Volume 38, Issue 8
Show Author Affiliations
David T. Schaafsma, Univ. Research Foundation (United States)
Reza Mossadegh, Infrared Fiber Systems , Inc. (United States)
Jasbinder Singh Sanghera, Naval Research Lab. (United States)
Ishwar D. Aggarwal, Naval Research Lab. (United States)
M. Luce, Istituto di Stuttura della Materia (Italy)
Renato Generosi, Instituto di Struttura della Materia CNR (Italy)
P. Perfetti, Lab. CNR-ISM (Italy)
Antonio Cricenti, Instituto di Struttura della Materia CNR (Italy)
Jonathan M. Gilligan, Vanderbilt Univ. (United States)
Norman H. Tolk, Vanderbilt Univ. (United States)


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