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Optical Engineering

Optical roughness measurements using extended white-light interferometry
Author(s): Robert Windecker; Hans J. Tiziani
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Paper Details

Date Published: 1 June 1999
PDF: 7 pages
Opt. Eng. 38(6) doi: 10.1117/1.602154
Published in: Optical Engineering Volume 38, Issue 6
Show Author Affiliations
Robert Windecker, Univ. of Stuttgart (Germany)
Hans J. Tiziani, Univ. Stuttgart (Germany)

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