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Optical Engineering

Precision profile measurement of aspheric surfaces by improved Ronchi test
Author(s): Ho-Jae Lee; Seung-Woo Kim
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Paper Details

Date Published: 1 June 1999
PDF: 7 pages
Opt. Eng. 38(6) doi: 10.1117/1.602147
Published in: Optical Engineering Volume 38, Issue 6
Show Author Affiliations
Ho-Jae Lee, KAIST (South Korea)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)

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