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Optical Engineering

Understanding image quality losses due to smear in high-resolution remote sensing imaging systems
Author(s): Steven L. Smith; James A. Mooney; Theodore A. Tantalo; Robert D. Fiete
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Paper Abstract

Space-based high-resolution scanning array imaging systems have the potential to introduce large amounts of image smear. When designing these systems, it is useful to understand how smear will degrade image quality. A brief description of the causes of smear and a simple mathematical model are presented. A series of image simulations (for a system in which ? FN/p = 1.0, where ? is the mean wavelength for a panchromatic system, FN is the system f number, and p is the pixel pitch of the detectors) are performed in which along scan smear (ranging from 1.0 to 8.0 pixels) is introduced. Using the National Imagery Inter- pretability Rating Scale (NIIRS), expert observers rated ?NIIRS difference in image quality between the images with simulated smear and the original "unsmeared" image. The functional relationship between smear error and image quality (in units of?NIIRS) is determined.

Paper Details

Date Published: 1 May 1999
PDF: 6 pages
Opt. Eng. 38(5) doi: 10.1117/1.602054
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Steven L. Smith, Eastman Kodak Co. (United States)
James A. Mooney, Eastman Kodak Co. (United States)
Theodore A. Tantalo, Eastman Kodak Co. (United States)
Robert D. Fiete, Eastman Kodak Co. (United States)

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