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Optical Engineering

Understanding image quality losses due to smear in high-resolution remote sensing imaging systems
Author(s): Steven L. Smith; James A. Mooney; Theodore A. Tantalo; Robert D. Fiete
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Paper Details

Date Published: 1 May 1999
PDF: 6 pages
Opt. Eng. 38(5) doi: 10.1117/1.602054
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Steven L. Smith, Eastman Kodak Co. (United States)
James A. Mooney, Eastman Kodak Co. (United States)
Theodore A. Tantalo, Eastman Kodak Co. (United States)
Robert D. Fiete, Eastman Kodak Co. (United States)


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