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Optical Engineering

Image quality of increased along-scan sampling for remote sensing systems
Author(s): Robert D. Fiete; Theodore A. Tantalo
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Paper Details

Date Published: 1 May 1999
PDF: 6 pages
Opt. Eng. 38(5) doi: 10.1117/1.602053
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Robert D. Fiete, Eastman Kodak Co. (United States)
Theodore A. Tantalo, Eastman Kodak Company (United States)

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