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Optical Engineering

Fixed-polarizer ellipsometry: a simple technique to measure the thickness of very thin films
Author(s): Brian Trotter; Garret Moddel; Rachel Ostroff; Gregory R. Bogart
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Paper Details

Date Published: 1 May 1999
PDF: 6 pages
Opt. Eng. 38(5) doi: 10.1117/1.602049
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Brian Trotter, Univ. of Colorado (United States)
Garret Moddel, Univ. of Colorado/Boulder (United States)
Rachel Ostroff, BioStar, Inc. (United States)
Gregory R. Bogart, Lucent Technologies/Bell Labs. (United States)

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