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Optical Engineering

Fidelity analysis of sampled imaging systems
Author(s): Stephen K. Park; Zia-ur Rahman
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Paper Details

Date Published: 1 May 1999
PDF: 15 pages
Opt. Eng. 38(5) doi: 10.1117/1.602047
Published in: Optical Engineering Volume 38, Issue 5
Show Author Affiliations
Stephen K. Park, College of William & Mary (United States)
Zia-ur Rahman, College of William & Mary (United States)

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