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Optical Engineering

Optical interconnect reliability
Author(s): Nickolaos E. Strifas; Paul Panayotatos; Aristos Christou
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Paper Details

Date Published: 1 August 1998
PDF: 3 pages
Opt. Eng. 37(8) doi: 10.1117/1.602023
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Nickolaos E. Strifas, Univ. of Maryland/College Park (United States)
Paul Panayotatos, Rutgers Univ. (United States)
Aristos Christou, Univ. of Maryland/College Park (United States)

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