Share Email Print
cover

Optical Engineering

Optical interconnect reliability
Author(s): Nickolaos E. Strifas; Paul Panayotatos; Aristos Christou
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to make appropriate technology choices for the system implementation of optical interconnects, the issues of reliability and manufacturability must be included in any figure of merit (FOM) calculation.

Paper Details

Date Published: 1 August 1998
PDF: 3 pages
Opt. Eng. 37(8) doi: 10.1117/1.602023
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Nickolaos E. Strifas, Univ. of Maryland/College Park (United States)
Paul Panayotatos, Rutgers Univ. (United States)
Aristos Christou, Univ. of Maryland/College Park (United States)


© SPIE. Terms of Use
Back to Top