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Optical Engineering

Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements
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Paper Abstract

A new method of electronic speckle pattern interferometry (ESPI) for in-plane deformation measurements is presented. Unlike usual ESPI methods used for in-plane deformation measurements with two symmetrical smooth illuminating waves, we introduce miniature speckling elements and thin laser beam illumination of them. The miniature elements serve for generating two symmetrical speckled waves. These miniature speckling elements are produced as reflection or transmission holograms. Nonholographic speckling elements were also tested. We present a family of flexible electronic speckle pattern interferometers for in-plane deformation analysis based on our method. Due to their simplicity, compactness, and low cost, the devices are ideally suited for industrial automated inspection. Experimental results obtained with the novel ESPI devices are given.

Paper Details

Date Published: 1 August 1998
PDF: 6 pages
Opt. Eng. 37(8) doi: 10.1117/1.602008
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Valery Petrov, Fachhochschule Ulm (Germany)
Bernhard Lau, Fachhochschule Ulm (Germany)


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