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Optical Engineering

Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements
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Paper Details

Date Published: 1 August 1998
PDF: 6 pages
Opt. Eng. 37(8) doi: 10.1117/1.602008
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Valery Petrov, Fachhochschule Ulm (Germany)
Bernhard Lau, Fachhochschule Ulm (Germany)


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