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Optical Engineering

Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination
Author(s): Jingbo Zhang
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Paper Details

Date Published: 1 August 1998
PDF: 8 pages
Opt. Eng. 37(8) doi: 10.1117/1.602007
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Jingbo Zhang, Data Storage Institute (Singapore)

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