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Optical Engineering

Adaptive bit-reduced mean absolute difference criterion for block-matching algorithm and its VLSI design
Author(s): HwangSeok Oh; Yunju Baek; Heung-Kyu Lee
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Paper Details

Date Published: 1 December 1998
PDF: 10 pages
Opt. Eng. 37(12) doi: 10.1117/1.601991
Published in: Optical Engineering Volume 37, Issue 12
Show Author Affiliations
HwangSeok Oh, KAIST (South Korea)
Yunju Baek, Ansung National Univ. (South Korea)
Heung-Kyu Lee, Korea Advanced Institute of Science and Technology (South Korea)


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