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Optical Engineering

Mass-producible microtags for security applications: calculated fabrication tolerances by rigorous coupled-wave analysis
Author(s): Michael R. Descour; William C. Sweatt; Kevin D. Krenz
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Paper Details

Date Published: 1 April 1998
PDF: 8 pages
Opt. Eng. 37(4) doi: 10.1117/1.601961
Published in: Optical Engineering Volume 37, Issue 4
Show Author Affiliations
Michael R. Descour, Optical Sciences Ctr./Univ. of Arizona (United States)
William C. Sweatt, Sandia National Labs. (United States)
Kevin D. Krenz, Sandia National Labs. (United States)

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