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Optical Engineering

Phase-shifting grating projection moire topography
Author(s): Yi-Bae Choi; Seung-Woo Kim
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Paper Abstract

A phase-shifting projection moire´ method particularly intended for high-speed three-dimensional inspection of fine objects is presented. Emphasis is on realization of phase-shifting fringe analysis in projection moire´ topography using a set of line grating pairs designed to provide different phase shifts in sequence. Further, a time-integral fringe capturing scheme is devised to remove undesirable high-frequency original grating patterns in real time without time-consuming software image processing. Finally, the performances of the proposed method are discussed with measurement results.

Paper Details

Date Published: 1 March 1998
PDF: 6 pages
Opt. Eng. 37(3) doi: 10.1117/1.601934
Published in: Optical Engineering Volume 37, Issue 3
Show Author Affiliations
Yi-Bae Choi, Korea Advanced Institute of Science and Technology (South Korea)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)


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