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Optical Engineering

Interface roughness statistics of thin films from angle resolved light scattering at three wavelengths
Author(s): Daniel Roennow
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Paper Details

Date Published: 1 February 1998
PDF: 9 pages
Opt. Eng. 37(2) doi: 10.1117/1.601870
Published in: Optical Engineering Volume 37, Issue 2
Show Author Affiliations
Daniel Roennow, Uppsala Univ. (Germany)

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