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Optical Engineering

Interferometric measurements of small-scale irregularities: highly reflecting surfaces
Author(s): Parameswaran Hariharan
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Paper Abstract

With uncoated optical surfaces, it is possible to use a Fizeau interferometer to make direct measurements of small-scale irregularities with very small amplitudes. However, problems arise with highly reflecting surfaces. Some optical systems that can be used for such measurements are described.

Paper Details

Date Published: 1 October 1998
PDF: 3 pages
Opt. Eng. 37(10) doi: 10.1117/1.601814
Published in: Optical Engineering Volume 37, Issue 10
Show Author Affiliations
Parameswaran Hariharan, CSIRO (Australia)


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