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Optical Engineering

Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems
Author(s): Hong Wei; Eion Johnston; T. David Binnie
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Paper Details

Date Published: 1 September 1998
PDF: 9 pages
Opt. Eng. 37(9) doi: 10.1117/1.601778
Published in: Optical Engineering Volume 37, Issue 9
Show Author Affiliations
Hong Wei, Napier Univ. (United Kingdom)
Eion Johnston, Napier Univ. (United Kingdom)
T. David Binnie, Napier Univ. (United Kingdom)

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