Share Email Print

Optical Engineering

Extended averaging and data windowing techniques in phase-stepping measurements: an approach using the characteristic polynomial theory
Author(s): Yves Surrel
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The extended averaging technique and the data windowing technique used in phase-stepping are investigated using the characteristic polynomials. It is shown that the phase measurement algorithms derived using the extended averaging technique are not in general more efficient and may require more samples than those obtained directly from the rules of the characteristic polynomial theory.

Paper Details

Date Published: 1 August 1998
PDF: 6 pages
Opt. Eng. 37(8) doi: 10.1117/1.601753
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Yves Surrel, Ecole des Mines de Saint-Etienne (France)

© SPIE. Terms of Use
Back to Top