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Optical Engineering

Extended averaging and data windowing techniques in phase-stepping measurements: an approach using the characteristic polynomial theory
Author(s): Yves Surrel
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Paper Details

Date Published: 1 August 1998
PDF: 6 pages
Opt. Eng. 37(8) doi: 10.1117/1.601753
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Yves Surrel, Ecole des Mines de Saint-Etienne (France)


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