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Optical Engineering

Observation and discrimination of the mode patterns in a micron-sized hollow optical fiber and its synthetic measurements: far-field micro-imaging technique
Author(s): Jianping Yin; Kihwan Kim; Wooshik Shim; Yifu Zhu; Wonho Jhe
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Paper Details

Date Published: 1 August 1998
PDF: 7 pages
Opt. Eng. 37(8) doi: 10.1117/1.601748
Published in: Optical Engineering Volume 37, Issue 8
Show Author Affiliations
Jianping Yin, Suzhou Univ. (China)
Kihwan Kim, Seoul National University (South Korea)
Wooshik Shim, Seoul National Univ. (South Korea)
Yifu Zhu, Florida International Univ. (United States)
Wonho Jhe, Seoul National Univ. (South Korea)


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