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Optical Engineering

Apertureless near-field optical microscope in reflection and transmission modes
Author(s): Reda Laddada; Pierre Michel Adam; Pascal Royer; Jean Louis Bijeon
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Paper Abstract

Apertureless Scanning Near-field Optical Microscope (SNOM) receives an increasing interest in local imaging and analysis. We report a hybrid microscope composed of a commercial Atomic Force Microscope (AFM) and an apertureless SNOM, which operates both in reflection and transmission modes with several illumination and collection systems. The optical probe is a commercial AFM tip integrated on a silicon cantilever. The AFM is operated in the intermittent contact mode at the resonance frequency of the cantilever. We present the images obtained on a grating of cylindrical dots of aluminum (diameter is 200 nm, height is 20 nm) and we show the effects of some optical parameters (polarization, direction of illumination and collection) on the SNOM images.

Paper Details

Date Published: 1 July 1998
PDF: 6 pages
Opt. Eng. 37(7) doi: 10.1117/1.601720
Published in: Optical Engineering Volume 37, Issue 7
Show Author Affiliations
Reda Laddada, Univ. de Technologie de Troyes (France)
Pierre Michel Adam, Univ. de Technologie de Troyes (France)
Pascal Royer, Univ. de Technologie de Troyes (France)
Jean Louis Bijeon, Univ. de Technologie de Troyes (France)

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