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Optical Engineering

Online fast measurement of section sized of three-dimensional objects using binary image analysis
Author(s): WeiMing Ren; Yalei Wang; Hao Zhu; Peimao Sun
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Paper Details

Date Published: 1 June 1998
PDF: 6 pages
Opt. Eng. 37(6) doi: 10.1117/1.601691
Published in: Optical Engineering Volume 37, Issue 6
Show Author Affiliations
WeiMing Ren, Tsinghua Univ. (Japan)
Yalei Wang, Tsinghua University (China)
Hao Zhu, Tsinghua Univ. (China)
Peimao Sun, Tsinghua Univ. (China)

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