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Optical Engineering

Evaluation of hydroxyl content in commercial X-cut LiNbO3 wafers for optical waveguide devices
Author(s): Hirotoshi Nagata
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Paper Abstract

Usually the quality of commercial LiNbO3 (LN) wafers is checked by their crystalline homogeneity. In X cut wafers, which are labeled for optical waveguide applications, however, the existence of a significant change in the hydroxyl content along the polarized Z axis is found by Fourier transform IR (FTIR) spectrometry, although a corresponding inhomogeneity was not observed about the lattice parameters, the Li and Nb contents, and the optical birefringence parameters. Such a difference in hydroxyl content might influence quality and stability of the obtained waveguides, and one should consider this before designing waveguide devices and fabrication processes.

Paper Details

Date Published: 1 May 1998
PDF: 6 pages
Opt. Eng. 37(5) doi: 10.1117/1.601675
Published in: Optical Engineering Volume 37, Issue 5
Show Author Affiliations
Hirotoshi Nagata, Sumitomo Osaka Cement Co., Ltd. (Japan)

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