Share Email Print

Optical Engineering

Retroreflective grating analysis versus physical measurements of surface contour
Author(s): XianZhu Zhang; Walter P. T. North
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 May 1998
PDF: 4 pages
Opt. Eng. 37(5) doi: 10.1117/1.601661
Published in: Optical Engineering Volume 37, Issue 5
Show Author Affiliations
XianZhu Zhang, Univ. of Windsor (Canada)
Walter P. T. North, Univ. of Windsor (Canada)

© SPIE. Terms of Use
Back to Top