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Optical Engineering

Technique for rapid inspection of hermetic seals of microelectronic packages using shearography
Author(s): Y.Y. Hung; Dahuan Shi
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Paper Details

Date Published: 1 May 1998
PDF: 4 pages
Opt. Eng. 37(5) doi: 10.1117/1.601656
Published in: Optical Engineering Volume 37, Issue 5
Show Author Affiliations
Y.Y. Hung, Oakland Univ. (United States)
Dahuan Shi, Oakland Univ. (United States)


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