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Optical Engineering

Concepts of direct in-plane strain and variable sensitivity in-plane displacement measurements using high-resolution moire photography
Author(s): Pramod Kumar Rastogi
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Paper Abstract

High-resolution moire´ photography1,2 has been of interest for many years for the investigation of in-plane displacements over a large range of specimen dimensions. The method’s main advantages stem from its requirement to illuminate the object with white light, its user-friendliness in non-laboratory environments, and its ability to provide whole field visualization of the undergone deformations. Optical measurements are, however, available only in the form of displacement and not strain maps, a quantity often of more interest to the engineer.

Paper Details

Date Published: 1 January 1998
PDF: 4 pages
Opt. Eng. 37(1) doi: 10.1117/1.601620
Published in: Optical Engineering Volume 37, Issue 1
Show Author Affiliations
Pramod Kumar Rastogi, Swiss Federal Inst. of Tech. (Switzerland)

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