Share Email Print

Optical Engineering

Measuring the proximity effects in laser pattern generation
Author(s): Sergey V. Babin
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The possibility of increasing the resolution and accuracy of the photomask fabrication process is discussed when using a laser pattern generator. The proximity effect is first taken into account in this technique. The redistribution of laser beam energy in photoresist, which results in pattern distortions, can be characterized and used for the distortion compensation. The method for measuring absorbed energy density in photoresist is proposed, and experimental results are obtained for conditions used for a standard-type of photomask manufacturing process.

Paper Details

Date Published: 1 September 1997
PDF: 5 pages
Opt. Eng. 36(9) doi: 10.1117/1.601479
Published in: Optical Engineering Volume 36, Issue 9
Show Author Affiliations
Sergey V. Babin, Etec Systems, Inc. (United States)

© SPIE. Terms of Use
Back to Top