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Optical Engineering

Annealing effects on the properties of indium tin oxide films coated on soda lime glasses with a barrier layer of TiO2-SiO2 composite films
Author(s): Rung-Ywan Tsai; Fang Chung Ho; Mu-Yi Hua
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Paper Abstract

The structural, optical, and electrical properties of indium tin oxide (ITO) films coated on soda lime glasses with and without a barrier layer of TiO2-SiO2 composite films before and after annealing in air at 300 and 500 °C for 1 h have been systematically investigated using a x-ray diffractometer (XRD), spectrophotometer, and four-point probe, respectively. A TiO2-SiO2 barrier layer and an ITO layer were sequentially deposited onto unheated glass substrates by reactive ion-assisted electron-beam evaporation (IAD) using an advanced plasma source. Correlations between these properties and annealing temperatures and barrier-layer compositions are discussed. The suppression effect of a barrier layer on the outdiffusion of Na atoms from the soda lime glass substrate through the barrier layer into the ITO layer is investigated with secondary-ion mass spectrometry (SIMS). With respect to the optical and electrical requirements of ITO electrodes used in liquid crystal display (LCD) panels, ITO-coated soda lime glasses with a barrier layer of TiO2-SiO2 composite films with TiO2<50 at. % are superior to those with a barrier layer of SiO2.

Paper Details

Date Published: 1 August 1997
PDF: 6 pages
Opt. Eng. 36(8) doi: 10.1117/1.601461
Published in: Optical Engineering Volume 36, Issue 8
Show Author Affiliations
Rung-Ywan Tsai, Industrial Technology Research Institute (Taiwan)
Fang Chung Ho, Industrial Technology Research Institute (Taiwan)
Mu-Yi Hua, National Tsing Hua Univ. (Taiwan)


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