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Optical Engineering

Infrared interferometry for rough surface measurements: application to failure characterization and flaw detection
Author(s): Jaydeep K. Sinha; Hareesh V. Tippur
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Paper Details

Date Published: 1 August 1997
PDF: 7 pages
Opt. Eng. 36(8) doi: 10.1117/1.601447
Published in: Optical Engineering Volume 36, Issue 8
Show Author Affiliations
Jaydeep K. Sinha, Auburn Univ. (United States)
Hareesh V. Tippur, Auburn Univ. (United States)

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