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Optical Engineering

Infrared interferometry for rough surface measurements: application to failure characterization and flaw detection
Author(s): Jaydeep K. Sinha; Hareesh V. Tippur
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Paper Abstract

A real-time, full-field, noncontacting infrared Twyman-Green interferometer for performing deformation measurements has been developed. The choice of the wavelength offers the advantage of using the interferometer with structural components with little or no surface preparation. The limitation on the surface roughness/texture commonly encountered when using visible light is circumvented through a favorable roughness-to-wavelength ratio. Planar objects with a surface roughness up to ?a?1 ?m (or surfaces prepared using fixed abrasives with mean grit sizes up to 250?m) have been examined. Capability of the interferometer for quantifying deformations when dealing with rough surface measurements is demonstrated. Examples of defect detection as well as elastoplastic crack-tip-field mapping are provided.

Paper Details

Date Published: 1 August 1997
PDF: 7 pages
Opt. Eng. 36(8) doi: 10.1117/1.601447
Published in: Optical Engineering Volume 36, Issue 8
Show Author Affiliations
Jaydeep K. Sinha, Auburn Univ. (United States)
Hareesh V. Tippur, Auburn Univ. (United States)


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