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Optical Engineering

Polarization effects in speckle correlation metrology
Author(s): Mike Adams; Klaus D. Hinsch; Falk Lange; Karin Wolff
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Paper Abstract

The recent use of single mode fibers in electronic speckle pattern interferometry (ESPI) shows that it is possible to produce a small and compact system for the use even in a hostile environment. Standard single mode fibers are easy to handle but cannot preserve the polarization state of the input light when ambient conditions change during long term measurements. The quality of the ESPI fringes decreases and the performance of the measuring system suffers. Under this point of view the correlation of speckle patterns produced by light of different polarization states is investigated.

Paper Details

Date Published: 1 August 1997
PDF: 4 pages
Opt. Eng. 36(8) doi: 10.1117/1.601444
Published in: Optical Engineering Volume 36, Issue 8
Show Author Affiliations
Mike Adams, BIAS-Bremen Inst of Applied Beam Technol (Germany)
Klaus D. Hinsch, Carl von Ossietzky Univ. (Germany)
Falk Lange, Carl von Ossietzky Univ. (Germany)
Karin Wolff, Carl von Ossietzky Univ. (Germany)


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