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Optical Engineering

Polarization effects in speckle correlation metrology
Author(s): Mike Adams; Klaus D. Hinsch; Falk Lange; Karin Wolff
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Paper Details

Date Published: 1 August 1997
PDF: 4 pages
Opt. Eng. 36(8) doi: 10.1117/1.601444
Published in: Optical Engineering Volume 36, Issue 8
Show Author Affiliations
Mike Adams, BIAS-Bremen Inst of Applied Beam Technol (Germany)
Klaus D. Hinsch, Carl von Ossietzky Univ. (Germany)
Falk Lange, Carl von Ossietzky Univ. (Germany)
Karin Wolff, Carl von Ossietzky Univ. (Germany)

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