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Optical Engineering

Considerations on the finesse and resolving power of Fabry-Perot etalons for soft x rays
Author(s): Christophe Guichet; Georges Rasigni
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Paper Abstract

Some considerations of the spectroscopic performance of a soft x-ray Fabry-Pe´ rot e´ talon (XFPE) are presented. A whole study of the phase change on reflection of a soft x ray multilayer interferential mirror (MIM) has been necessary to evaluate the theoretical behavior of the order of interference of an XFPE. For grazing incidence angles, there is a linear dependence between the latter parameter and the grazing angle in the range of the diffraction Bragg peak. This property has enabled us to obtain local expressions for the finesse and the resolving power of an XFPE. Numerical simulations emphasize the interest of such a structure in x-ray spectroscopy.

Paper Details

Date Published: 1 July 1997
PDF: 5 pages
Opt. Eng. 36(7) doi: 10.1117/1.601384
Published in: Optical Engineering Volume 36, Issue 7
Show Author Affiliations
Christophe Guichet, Faculte des Sciences et Techniques de St. Jerome (France)
Georges Rasigni, Univ. d'Aix-Marseille III (France)

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