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Optical Engineering

Binary fractal image quantification using probe coherent beam scanning
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Paper Abstract

Some possibilities for binary 2-D fractal image characterization using correlation analysis of the transmitted light intensity fluctuations are discussed. These intensity fluctuations are produced by the probe coherent beam scanning of the studied object. Two different cases of diagnostics of the mass fractal structures are considered: with a broad collimated illuminating beam and with a sharply focused beam. Relationships between generalized characteristics of the studied structures (e.g., Hausdorff dimension) and asymptotic parameters of the structure functions of the intensity fluctuations (e.g., their exponents) are analyzed. Experimental results obtained with the specially prepared 2-D mass fractal structures (binary amplitude screens) are presented. Possible applications for morphological analysis of tissue structures are discussed.

Paper Details

Date Published: 1 May 1997
PDF: 9 pages
Opt. Eng. 36(5) doi: 10.1117/1.601373
Published in: Optical Engineering Volume 36, Issue 5
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