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Optical Engineering

Multiplexed Mach-Zehnder interferometer for multiphase current measurements
Author(s): Pieter L. Swart; Stephanus J. Spammer; David C. Theron
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Paper Details

Date Published: 1 June 1997
PDF: 4 pages
Opt. Eng. 36(6) doi: 10.1117/1.601327
Published in: Optical Engineering Volume 36, Issue 6
Show Author Affiliations
Pieter L. Swart, Rand Afrikaans Univ. (South Africa)
Stephanus J. Spammer, Univ. of Pretoria (United States)
David C. Theron, Rand Afrikaans Univ. (South Africa)


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