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Optical Engineering

All-optical probing of material structure by second harmonic generation: application to piezoelectric aluminium nitride thin films
Author(s): Daniele Blanc; Alain Cachard; Jean Claude Pommier
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Paper Abstract

Second-harmonic generation can be used to probe the microstructure of materials. This nondestructive all-optical method is applied to quantify the orientation of the aluminum nitride microcolumns. Theoretical results show that very small tilt angles of the columns are easily detectable. The sensitivity of this technique is confirmed by experimental results, which are compared with piezoelectric measurements

Paper Details

Date Published: 1 April 1997
PDF: 5 pages
Opt. Eng. 36(4) doi: 10.1117/1.601240
Published in: Optical Engineering Volume 36, Issue 4
Show Author Affiliations
Daniele Blanc, Univ. Jean Monnet (Canada)
Alain Cachard, Univ. Jean Monnet (France)
Jean Claude Pommier, Univ. Jean Monnet (France)

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