Share Email Print
cover

Optical Engineering

Quantitative characterization of material inhomogeneities by thermal waves
Author(s): Uwe R. Seidel; Ton Thi Ngoc Lan; Heinz-Guenter Walther; Bernhard Schmitz; Jurgen Geerkens; Gert Goch
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

Photothermal measurement techniques offer the possibility to determine thermal properties on and below the sample’s surface. Thus, subsurface thermal inhomogeneities such as defects, buried structures, and continuous profiles of thermal parameters become accessible by photothermal means. Our special interest is focused on the quantitative characterization of material modifications in near-surface layers that are induced by thermal (such as hardening) or mechanical (such as grinding) treatments of the surface as well as the reconstruction of a subsurface structure’s depth, size, and defect strength. Altogether, these investigations are aimed to develop photothermal techniques toward a true quantitative and noncontact inspection method for the nondestructive evaluation of opaque solids.

Paper Details

Date Published: 1 February 1997
PDF: 15 pages
Opt. Eng. 36(2) doi: 10.1117/1.601235
Published in: Optical Engineering Volume 36, Issue 2
Show Author Affiliations
Uwe R. Seidel, Friedrich-Schiller-Univ. Jena (Germany)
Ton Thi Ngoc Lan, Friedrich Schiller Univ. Jena (Germany)
Heinz-Guenter Walther, Friedrich-Schiller-Univ. (Germany)
Bernhard Schmitz, Univ. Ulm (Germany)
Jurgen Geerkens, Institut fuer Lasertechnologien in der Medizin (Germany)
Gert Goch, Institut fuer Lasertechnologien in der Medizin and Univ. Ulm (Germany)


© SPIE. Terms of Use
Back to Top