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Optical Engineering

Investigation of the absorption induced damage in ultraviolet dielectric thin films
Author(s): Eberhard Welsch; K. Ettrich; Holger Blaschke; Peter Thomsen-Schmidt; Dieter Schaefer; Norbert Kaiser
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Paper Details

Date Published: 1 February 1997
PDF: 11 pages
Opt. Eng. 36(2) doi: 10.1117/1.601222
Published in: Optical Engineering Volume 36, Issue 2
Show Author Affiliations
Eberhard Welsch, Friedrich-Schiller-Univ. Jena (Germany)
K. Ettrich, Friedrich-Schiller-Univ. Jena (Germany)
Holger Blaschke, Friedrich-Schiller-Univ. (Germany)
Peter Thomsen-Schmidt, Berline Institut for Optik GMBH (Germany)
Dieter Schaefer, Berliner Institut fuer Optik GmbH (Germany)
Norbert Kaiser, Fraunhofer Institution for Applied Optics and Precision Engineering (Germany)

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