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Optical Engineering

Phase unwrapping algorithm based on reliability and edge detection
Author(s): Jie-Lin Li; Xianyu Su; Ji-Tao Li
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Paper Details

Date Published: 1 June 1997
PDF: 6 pages
Opt. Eng. 36(6) doi: 10.1117/1.601194
Published in: Optical Engineering Volume 36, Issue 6
Show Author Affiliations
Jie-Lin Li, Sichuan Union Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Ji-Tao Li, Sichuan Univ. (China)

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