Share Email Print
cover

Optical Engineering

Phase unwrapping algorithm based on reliability and edge detection
Author(s): Jie-Lin Li; Xianyu Su; Ji-Tao Li
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

A new phase unwrapping algorithm based on reliability and edge detection is presented. Since the edge is detected efficiently through edge relaxation, the unwrapping procedure is simplified within the areas embraced by edges. Penetrating edges according to reliability ensures that this method will limit the unwrapping error to local-minimum areas at worst.

Paper Details

Date Published: 1 June 1997
PDF: 6 pages
Opt. Eng. 36(6) doi: 10.1117/1.601194
Published in: Optical Engineering Volume 36, Issue 6
Show Author Affiliations
Jie-Lin Li, Sichuan Union Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Ji-Tao Li, Sichuan Univ. (China)


© SPIE. Terms of Use
Back to Top