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Optical Engineering

Testing parameters in a common test method for phi90 mm/600 Mbyte phase-change optical disks
Author(s): Seiya Yamada; Takahiro Kubo; Kohei Yamauchi; Junji Ohtsubo; Masahisa Shinoda; T. Utakouji; Toshiaki Iwai
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Paper Details

Date Published: 1 December 1996
PDF: 6 pages
Opt. Eng. 35(12) doi: 10.1117/1.601115
Published in: Optical Engineering Volume 35, Issue 12
Show Author Affiliations
Seiya Yamada, Shizuoka Univ. (Japan)
Takahiro Kubo, Shizuoka Univ. (Japan)
Kohei Yamauchi, Shizuoka Univ. (Japan)
Junji Ohtsubo, Shizuoka Univ. (Japan)
Masahisa Shinoda, Mitsubishi Electric Corp. (Japan)
T. Utakouji, Mitsubishi Electric Corp. (Japan)
Toshiaki Iwai, Hokkaido Univ. (Japan)


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