Share Email Print
cover

Optical Engineering

Testing parameters in a common test method for phi90 mm/600 Mbyte phase-change optical disks
Author(s): Seiya Yamada; Takahiro Kubo; Kohei Yamauchi; Junji Ohtsubo; Masahisa Shinoda; T. Utakouji; Toshiaki Iwai
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Six samples of phase-change optical disks made by several different manufacturers are evaluated using the developed tester. It is observed that the dependence of recording and erase characteristics on the linear velocity of laser beam scanning on the track and frequency of recording signal were very much affected by laser power. The phase jitter is measured by a proposed test method and the effects of disk tilt and mark distortion on the measured values are indicated by a computer simulation. Common testing methods are discussed and some results of common tests are presented.

Paper Details

Date Published: 1 December 1996
PDF: 6 pages
Opt. Eng. 35(12) doi: 10.1117/1.601115
Published in: Optical Engineering Volume 35, Issue 12
Show Author Affiliations
Seiya Yamada, Shizuoka Univ. (Japan)
Takahiro Kubo, Shizuoka Univ. (Japan)
Kohei Yamauchi, Shizuoka Univ. (Japan)
Junji Ohtsubo, Shizuoka Univ. (Japan)
Masahisa Shinoda, Mitsubishi Electric Corp. (Japan)
T. Utakouji, Mitsubishi Electric Corp. (Japan)
Toshiaki Iwai, Hokkaido Univ. (Japan)


© SPIE. Terms of Use
Back to Top