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Optical Engineering

Aberrations introduced in off-axis testing of spherical surfaces
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Paper Abstract

It is well known that off-axis testing of a spherical surface introduces aberrations, mainly primary astigmatism. The magnitudes of these aberrations are discussed and analytically calculated. Their influence in several testing configurations is discussed. A case of particular interest is when a linear carrier fringe pattern is used in a Fizeau interferometer.

Paper Details

Date Published: 1 November 1996
PDF: 5 pages
Opt. Eng. 35(11) doi: 10.1117/1.601064
Published in: Optical Engineering Volume 35, Issue 11
Show Author Affiliations
Daniel Malacara-Hernandez, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Manuel Servin Guirado, Ctr. de Investigaciones en Optica, A.C. (Mexico)


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