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Optical Engineering

Edge quality metric for arbitrary two-dimensional edges
Author(s): Paul V. Khvorostov; Michael Braun; Colin S. Poon
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Paper Details

Date Published: 1 November 1996
PDF: 5 pages
Opt. Eng. 35(11) doi: 10.1117/1.601060
Published in: Optical Engineering Volume 35, Issue 11
Show Author Affiliations
Paul V. Khvorostov, Univ. of Technology, Sydney (Australia)
Michael Braun, Univ. of Technology Sydney (Australia)
Colin S. Poon, Univ. of Technology Sydney (Australia)


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