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Optical Engineering

Edge quality metric for arbitrary two-dimensional edges
Author(s): Paul V. Khvorostov; Michael Braun; Colin S. Poon
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Paper Abstract

A quality metric for an arbitrary 2D edge contour is presented. This metric is constructed from measured physical characteristics of the edge. It enables a comparison of performance of different edge detecting algorithms and provides a tool for the optimization of edge detectors. The metric was verified using the Canny’s edge detector applied to a set of artificial images varying in image quality.

Paper Details

Date Published: 1 November 1996
PDF: 5 pages
Opt. Eng. 35(11) doi: 10.1117/1.601060
Published in: Optical Engineering Volume 35, Issue 11
Show Author Affiliations
Paul V. Khvorostov, Univ. of Technology, Sydney (Australia)
Michael Braun, Univ. of Technology Sydney (Australia)
Colin S. Poon, Univ. of Technology Sydney (Australia)


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