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Optical Engineering

Texture characterization and defect detection using adaptive wavelets
Author(s): Warren J. Jasper; Stephen J. Garnier; Harsh Potlapalli
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Paper Details

Date Published: 1 November 1996
PDF: 10 pages
Opt. Eng. 35(11) doi: 10.1117/1.601054
Published in: Optical Engineering Volume 35, Issue 11
Show Author Affiliations
Warren J. Jasper, North Carolina State Univ. (United States)
Stephen J. Garnier, North Carolina State Univ. (United States)
Harsh Potlapalli, North Carolina State Univ. (United States)


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