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Optical Engineering

Subsurface defect detection in ceramic materials using optical gating techniques
Author(s): Philip R. Battle; Mark Bashkansky; Rita Mahon; John F. Reintjes
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Paper Abstract

We demonstrate the use of optical gating techniques for determining the size and location of defects in advanced ceramic materials. The subsurface region in a bearing-grade silicon nitride ceramic material is probed using an optical gate based on broadband Raman scattering. Experimental results indicate that the size and distribution of small subsurface defects can be determined.

Paper Details

Date Published: 1 April 1996
PDF: 5 pages
Opt. Eng. 35(4) doi: 10.1117/1.601031
Published in: Optical Engineering Volume 35, Issue 4
Show Author Affiliations
Philip R. Battle, U.S. Naval Academy (United States)
Mark Bashkansky, Naval Research Lab. (United States)
Rita Mahon, Naval Research Lab. (United States)
John F. Reintjes, Naval Research Lab. (United States)


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