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Optical Engineering

Pulsed-laser deposition of thin-film process characterization by optical spectroscopy
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Paper Details

Date Published: 1 May 1996
PDF: 5 pages
Opt. Eng. 35(5) doi: 10.1117/1.601028
Published in: Optical Engineering Volume 35, Issue 5
Show Author Affiliations
Ileana Apostol, Institute of Atomic Physics (Romania)
Razvan Stoian, Institute of Atomic Physics (Germany)


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